Research Group of the State Key Laboratory of Transducer Technology, Shanghai Institute of Microsystem and Information Technology (SIMIT), Chinese Academy of Sciences cooperated with the research specialist staff of the Department of Neurosurgery, Fushan University [ Learn more ]
On the morning of March 4, at the invitation of Xie Xiaoming, Deputy Director of Shanghai Institute of Microsystem and Information Technology (SIMIT), Dr. Peter Gregory, Editor-in-chief of Advanced Materials, along with Dr. Gudrun Walter, Senior Editor of Wiley[ Learn more ]
The 22nd International Conference on Ion Beam Modification of Materials, co-sponsored by GNS National Research Center of New Zealand, Australian National University and the University of Melbourne, was held in Wellington, the capital of New Zealand from Oct 30 to Nov 4. Experts and scholars from more than 20 countries and regions attended the academic conference. [ Learn more ]
The 7th International Workshop on Bismuth-Containing Semiconductors: Growth, Properties and Devices, sponsored by Shanghai Institute of Microsystem and Information Technology (SIMIT), Chinese Academy of Sciences, was successfully held in New World Shanghai Hotel from July 24 to 27, 2016. This is the first time that these series of international workshops were held in Asia. More than 80 delegates from 12 countries around the world attended the workshop, including over 30 foreign delegates. Wang Shumin, researcher of SIMIT and winner of "1000 Talents Plan", international renowned expert on compound semiconductors, served as chairman of the workshop and extended the welcome address on behalf of SIMIT. The workshop was honored to invite eig...[ Learn more ]
To further enhance the quality of patent applications, give full play to the role of patent system incentives and protection of innovation, to support our innovation-driven development, Shanghai Microsystems on April 28 to carry out the 2017 intellectual property publicity weekend activities theme: How to Improve the Authorization Rate of Invention Patent.[ Learn more ]