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Opening Ceremony of SIMIT-IMEC Joint Initiative on IOT
2012-03-26 | A A A  【print】【close

March 19th, 2012, the Joint Initiative on Internet of Things (IOT) established by SIMIT and IMEC was successfully started. Mr. Peter Potman, Consul-General Consulate-General of the Kingdom of the Netherlands in Shanghai and Dr. Qi Ming, Vice Director of SIMIT unveiled the Plaque. Mr. Jan Reint Smit, Counsellor for Science & Technology Embassy of the Kingdom of the Netherlands in Beijing; Mr. Jaap van Etten Attaché for Science & Technology

Consulate-General of the Kingdom of the Netherlands in Shanghai;Mr. Luc Van den hove

CEO of IMEC; Liu Haifeng, Vice director of the International Cooperation of Science and Technology Commission of Shanghai Municipality, YU Yuehui, vice director of SIMIT; WANG Yingguan, Assistant director of SIMIT; TIAN Tong, Vice director of the IOT System Technology Laboratory attended the ceremony.

Prof. YU Yuehui held the ceremony, prof. TIAN Tong introduced the general situation, structure, equipments and develop plan of the laboratory. GAO Teng, General Manager of IMEC China introduced the research activities of IMEC HOLST Center and the cooperation between China and Dutch.

IMEC Holst center holds technical advantages over the world in Ultra-low power wireless communication and SIMIT are famous in China for its sensor technologies, IOT system technologies as well as ULP Chip design technologies. The joint initiative will try to integrate all those advanced technologies to support jointly IOT technology research and industrialization, especially for Body area network technologies.

Currently the joint Initiative occupies more than 200 m2 area in Jiading Compus; the equipments include probe station, Spectrum analyzer, Vector network analyzer and Vector signal generator covering frequency from 100MHz to 67GHz. The joint Initiative has its own EDA system equipped with all important system and IC design soft ware and be able to support more than 15 designers and multi-project design. A committee consisting of senior researchers and managers from both sides steers the research and management of the lab. With the support from Shanghai IOT Center and driven by industries and organizations, the joint initiative will push and lead the research and industrialization of the domestic core IOT IPs and technologies.

 
Visiting Exhibition Room (Picture provided by SIMIT)
 
Equipment testing (Picture provided by SIMIT)
 
 
Unveiling the plague (Picture provided by SIMIT)
 
Group photo (Picture provided by SIMIT) 
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